442 search results - page 14 / 89 » Combining test case generation for component and integration... |
ASPDAC
2006
ACM
15 years 7 months ago
2006
ACM
– An instruction set level reference model was developed for the development of synergistic processing unit (SPU) , which is one of the key components of the cell processor [1][2...
101
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TII
2008
15 years 1 months ago
2008
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
109
Voted
COMPSAC
2008
IEEE
15 years 2 months ago
2008
IEEE
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...
98
Voted
ATAL
2008
Springer
15 years 3 months ago
2008
Springer
This paper investigates software agents testing, and in particular how to automate test generation. We propose a novel approach, which takes advantage of agent interaction ontolog...
170
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JAVACARD
2000
15 years 5 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...