442 search results - page 15 / 89 » Combining test case generation for component and integration... |
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
ATS
2009
IEEE
15 years 2 months ago
2009
IEEE
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
QSIC
2003
IEEE
15 years 2 months ago
2003
IEEE
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
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AMOST
2007
ACM
15 years 1 months ago
2007
ACM
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...