22 search results - page 2 / 5 » Compact structural test generation for analog macros |
122
Voted
GECCO
2003
Springer
15 years 6 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
109
Voted
DATE
2000
IEEE
15 years 5 months ago
2000
IEEE
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
108
Voted
VLSID
2005
IEEE
16 years 1 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
88
Voted
ICSE
2003
IEEE-ACM
16 years 1 months ago
2003
IEEE-ACM
g Test Suites via Operational Abstraction Michael Harder Jeff Mellen Michael D. Ernst MIT Lab for Computer Science 200 Technology Square Cambridge, MA 02139 USA {mharder,jeffm,mern...
188
Voted
CP
2009
Springer
16 years 1 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...