System on Chip architectures have traditionally relied upon bus based interconnect for their communication needs. However, increasing bus frequencies and the load on the bus calls...
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
In this paper, we study temperature-constrained hard realtime systems, where real-time guarantees must be met without exceeding safe temperature levels within the processor. Dynam...
— Experiments in real satellite testbeds are relatively rare in practice. In this paper, we are going to share our experience on using one, and comment on selected sets of result...
Cesar Marcondes, Anders Persson, M. Y. Sanadidi, M...