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DFT
2005
IEEE
132views VLSI» more  DFT 2005»
15 years 6 months ago
Low Power BIST Based on Scan Partitioning
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
Jinkyu Lee, Nur A. Touba
COLT
2008
Springer
15 years 6 months ago
Model Selection and Stability in k-means Clustering
Clustering Stability methods are a family of widely used model selection techniques applied in data clustering. Their unifying theme is that an appropriate model should result in ...
Ohad Shamir, Naftali Tishby
CSL
2008
Springer
15 years 6 months ago
On the Almighty Wand
We investigate decidability, complexity and expressive power issues for (first-order) separation logic with one record field (herein called SL) and its fragments. SL can specify pr...
Rémi Brochenin, Stéphane Demri, &Eac...
EUROCRYPT
2008
Springer
15 years 6 months ago
Precise Concurrent Zero Knowledge
Precise zero knowledge introduced by Micali and Pass (STOC'06) guarantees that the view of any verifier V can be simulated in time closely related to the actual (as opposed t...
Omkant Pandey, Rafael Pass, Amit Sahai, Wei-Lung D...
ICWSM
2010
15 years 6 months ago
A Second Chance to Make a First Impression: Factors Affecting the Longevity of Online Dating Relationships
This research explored the transition of romantic relationships from meeting online to the first face-to-face date. It is inevitable that impressions of a partner will change to s...
Lindsay Shaw Taylor, Andrew T. Fiore, G. A. Mendel...