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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
15 years 10 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
SIGMOD
2011
ACM
158views Database» more  SIGMOD 2011»
14 years 6 months ago
Workload-aware database monitoring and consolidation
In most enterprises, databases are deployed on dedicated database servers. Often, these servers are underutilized much of the time. For example, in traces from almost 200 producti...
Carlo Curino, Evan P. C. Jones, Samuel Madden, Har...
167
Voted
TCAD
2008
114views more  TCAD 2008»
15 years 3 months ago
Three-Dimensional Chip-Multiprocessor Run-Time Thermal Management
Three-dimensional integration has the potential to improve the communication latency and integration density of chip-level multiprocessors (CMPs). However, the stacked highpower de...
Changyun Zhu, Zhenyu (Peter) Gu, Li Shang, Robert ...
131
Voted
MCS
2004
Springer
15 years 9 months ago
Experiments on Ensembles with Missing and Noisy Data
Abstract. One of the potential advantages of multiple classifier systems is an increased robustness to noise and other imperfections in data. Previous experiments on classificati...
Prem Melville, Nishit Shah, Lilyana Mihalkova, Ray...
DAGSTUHL
2007
15 years 5 months ago
Lifetime Extension of Higher Class UHF RFID Tags using special Power Management Techniques and Energy Harvesting Devices
Abstract. Enhanced RFID tag technology especially in the UHF frequency range provides extended functionality like high operating range and sensing and monitoring capabilities. Such...
Alex Janek, Christian Steger, Josef Preishuber-Pfl...