5595 search results - page 793 / 1119 » Comparing Subsumption Optimizations |
196
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ICCAD
2008
IEEE
16 years 4 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
209
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ICCAD
2007
IEEE
16 years 4 months ago
2007
IEEE
— Small gates, such as AND2, XOR2 and MUX2, have been mixed with lookup tables (LUTs) inside the programmable logic block (PLB) to reduce area and power and increase performance ...
180
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
In this paper, we propose the first wire density driven global routing that considers CMP variation and timing. To enable CMP awareness during global routing, we propose a compac...
172
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ICCAD
2005
IEEE
16 years 4 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
178
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ICCAD
2005
IEEE
16 years 4 months ago
2005
IEEE
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...