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VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
CVPR
2010
IEEE
15 years 6 months ago
2010
IEEE
Graph cuts methods are at the core of many state-of-theart algorithms in computer vision due to their efficiency in computing globally optimal solutions. In this paper, we solve t...
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LCTRTS
2010
Springer
14 years 8 months ago
2010
Springer
The issues of compiler optimization phase ordering and selection present important challenges to compiler developers in several domains, and in particular to the speed, code size,...
CEC
2010
IEEE
14 years 11 months ago
2010
IEEE
Inspired originally by the Learnable Evolution Model(LEM) [5], we investigate LEM(ID3), a hybrid of evolutionary search with ID3 decision tree learning. LEM(ID3) involves interleav...
ECCV
2010
Springer
14 years 8 months ago
2010
Springer
Sturm-Triggs iteration is a standard method for solving the projective factorization problem. Like other iterative algorithms, this method suffers from some common drawbacks such ...