Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Obesity has risen to epidemic levels in the United States and around the world. Global indices of obesity such as the body mass index (BMI) have been known to be inaccurate predict...
Xenophon Papademetris, Pavel Shkarin, Lawrence H. ...
In many real-world classification problems the input contains a large number of potentially irrelevant features. This paper proposes a new Bayesian framework for determining the r...
Yuan (Alan) Qi, Thomas P. Minka, Rosalind W. Picar...