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» Comparison of Open and Resistive-Open Defect Test Conditions...
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ATS
2003
IEEE
106views Hardware» more  ATS 2003»
14 years 3 months ago
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
ET
2007
119views more  ET 2007»
13 years 10 months ago
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...