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Comparison of Open and Resistive-Open Defect Test Conditions...
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Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
14 years 3 months ago
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Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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2007
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Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits
13 years 10 months ago
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In this paper, we present an exhaustive study on the influence of resistive-open defects in pre-charge circuits of SRAM memories. In SRAM memories, the pre-charge circuits operate...
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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