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TASE
2008
IEEE
14 years 10 months ago
Compensation of Scanner Creep and Hysteresis for AFM Nanomanipulation
Babak Mokaberi, Aristides A. G. Requicha
ICRA
2007
IEEE
136views Robotics» more  ICRA 2007»
15 years 4 months ago
Automated Nanomanipulation with Atomic Force Microscopes
Abstract—Automation has long been recognized as an important goal in AFM (Atomic Force Microscope) nanomanipulation research. For the precise manipulation of small particles with...
Babak Mokaberi, Jaehong Yun, Michael Wang, Aristid...