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ESEM
2009
ACM
15 years 5 months ago
Test coverage and post-verification defects: A multiple case study
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-...
GLVLSI
2009
IEEE
172views VLSI» more  GLVLSI 2009»
15 years 5 months ago
Contact merging algorithm for efficient substrate noise analysis in large scale circuits
A methodology is proposed to efficiently estimate the substrate noise generated by large scale aggressor circuits. Small spatial voltage differences within the ground distribution...
Emre Salman, Renatas Jakushokas, Eby G. Friedman, ...
IAT
2009
IEEE
15 years 5 months ago
Offline Planning for Communication by Exploiting Structured Interactions in Decentralized MDPs
Variants of the decentralized MDP model focus on problems exhibiting some special structure that makes them easier to solve in practice. Our work is concerned with two main issues...
Hala Mostafa, Victor R. Lesser
ASYNC
2004
IEEE
102views Hardware» more  ASYNC 2004»
15 years 5 months ago
Non-Uniform Access Asynchronous Register Files
Register files of microprocessors have often been cited as performance bottlenecks and significant consumers of energy. The robust and modular nature of quasi-delay insensitive (Q...
David Fang, Rajit Manohar
CGO
2004
IEEE
15 years 5 months ago
Exploring Code Cache Eviction Granularities in Dynamic Optimization Systems
Dynamic optimization systems store optimized or translated code in a software-managed code cache in order to maximize reuse of transformed code. Code caches store superblocks that...
Kim M. Hazelwood, James E. Smith