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DATE
2010
IEEE
129views Hardware» more  DATE 2010»
15 years 4 months ago
Block-level bayesian diagnosis of analogue electronic circuits
—Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue...
Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Han...
ISSRE
2002
IEEE
15 years 4 months ago
Effect of Disturbances on the Convergence of Failure Intensity
We report a study to determine the impact of four types of disturbances on the failure intensity of a software product undergoing system test. Hardware failures, discovery of a cr...
João W. Cangussu, Aditya P. Mathur, Raymond...
LATA
2010
Springer
15 years 8 months ago
Untestable Properties Expressible with Four First-Order Quantifiers
Abstract. In property testing, the goal is to distinguish between structures that have some desired property and those that are far from having the property, after examining only a...
Charles Jordan and Thomas Zeugmann
DATE
2006
IEEE
352views Hardware» more  DATE 2006»
15 years 5 months ago
Fast-prototyping using the BTnode platform
The BTnode platform is a versatile and flexible platform for functional prototyping of ad hoc and sensor networks. Based on an Atmel microcontroller, a Bluetooth radio and a low-...
Jan Beutel
WACV
2005
IEEE
15 years 4 months ago
Gait Verification Using Probabilistic Methods
In this paper we describe a novel method for gait based identity verification based on Bayesian classification. The verification task is reduced to a two class problem (Client or ...
Alex I. Bazin, Mark S. Nixon