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DATE
2009
IEEE
77views Hardware» more  DATE 2009»
15 years 6 months ago
On the relationship between stuck-at fault coverage and transition fault coverage
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
Jan Schat
MTDT
2003
IEEE
105views Hardware» more  MTDT 2003»
15 years 4 months ago
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu L...
PPSN
1998
Springer
15 years 3 months ago
Modeling Building-Block Interdependency
The Building-Block Hypothesis appeals to the notion of problem decomposition and the assembly of solutions from sub-solutions. Accordingly, there have been many varieties of GA tes...
Richard A. Watson, Gregory Hornby, Jordan B. Polla...
CVPR
2006
IEEE
15 years 1 months ago
Locally Linear Models on Face Appearance Manifolds with Application to Dual-Subspace Based Classification
Recently, there has been a flurry of research on face recognition based on multiple images or shots from either a video sequence or an image set. This paper is also such an attemp...
Wei Fan, Dit-Yan Yeung
SDL
2007
152views Hardware» more  SDL 2007»
15 years 20 days ago
TTCN-3 Quality Engineering: Using Learning Techniques to Evaluate Metric Sets
Software metrics are an essential means to assess software quality. For the assessment of software quality, typically sets of complementing metrics are used since individual metric...
Edith Werner, Jens Grabowski, Helmut Neukirchen, N...