Sciweavers

4647 search results - page 511 / 930
» Composite Design Patterns
Sort
View
ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
16 years 1 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
UIST
2009
ACM
15 years 11 months ago
Relaxed selection techniques for querying time-series graphs
Time-series graphs are often used to visualize phenomena that change over time. Common tasks include comparing values at different points in time and searching for specified patte...
Christian Holz, Steven Feiner
DATE
2007
IEEE
56views Hardware» more  DATE 2007»
15 years 11 months ago
Unknown blocking scheme for low control data volume and high observability
This paper presents a new blocking logic to block unknowns for temporal compactors. The proposed blocking logic can reduce data volume required to control the blocking logic and a...
Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar
ICCV
2007
IEEE
15 years 11 months ago
A reliable skin mole localization scheme
Mole pattern changes are important cues in detecting melanoma at an early stage. As a first step to automatically register mole pattern changes from skin images, this paper prese...
Taeg Sang Cho, William T. Freeman, Hensin Tsao
TIME
2007
IEEE
15 years 11 months ago
Multilingual Extension of Temporal Expression Recognition Using Parallel Corpora
This paper presents the automatic extension of TERSEO to other languages, a knowledge-based system for the recognition and normalization of temporal expressions, originally develo...
Marcel Puchol-Blasco, Estela Saquete, Patricio Mar...