4647 search results - page 523 / 930 » Composite Design Patterns |
138
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ISPD
2010
ACM
15 years 11 months ago
2010
ACM
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
128
Voted
IV
2000
IEEE
15 years 9 months ago
2000
IEEE
“addiction” is defined as a pattern (abstract relationship). Such definition allows us to look in a new way at a number of cultural issues including the values, the lifestyl...
176
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DAC
2010
ACM
15 years 8 months ago
2010
ACM
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...
145
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CG
2010
Springer
15 years 3 months ago
2010
Springer
Generating, grouping, and labeling free-sketch data is a difficult and time-consuming task for both user study participants and researchers. To simplify this process for both part...
137
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ECBS
2006
IEEE
15 years 11 months ago
2006
IEEE
For complex systems that are reusing intellectual property components, functional and compositional design correctness are an important part of the design process. Common system l...