— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
Vladimir Pasca, Lorena Anghel, Claudia Rusu, Ricca...
Web applications such as web-based email, spreadsheets and form filling applications have become ubiquitous. However, many of the tasks that users try to accomplish with such web ...
This paper looks at the problem of data prioritization, commonly found in mobile ad-hoc networks. The proposed general solution uses a machine learning approach in order to learn ...
The UML lacks precise and formal foundations for several constructs such as transition guards or method bodies, for which it resorts to semantic loopholes in the form of “uninter...