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113
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ICCAD
1998
IEEE
96views Hardware» more  ICCAD 1998»
15 years 7 months ago
Test set compaction algorithms for combinational circuits
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
Ilker Hamzaoglu, Janak H. Patel
174
Voted
TSE
2010
120views more  TSE 2010»
14 years 10 months ago
Efficient Software Verification: Statistical Testing Using Automated Search
Statistical testing has been shown to be more efficient at detecting faults in software than other methods of dynamic testing such as random and structural testing. Test data are g...
Simon M. Poulding, John A. Clark
126
Voted
CMSB
2008
Springer
15 years 5 months ago
Analyzing a Discrete Model of Aplysia Central Pattern Generator
We present a discrete formal model of the central pattern generator (CPG) located in the buccal ganglia of Aplysia that is responsible for mediating the rhythmic movements of its f...
Ashish Tiwari, Carolyn L. Talcott
89
Voted
ICRA
2006
IEEE
81views Robotics» more  ICRA 2006»
15 years 9 months ago
Hardware-in-the-loop Test Rig for Designing Near-earth Aerial Robotics
Today’s aerial robots are being tasked to fly in nearEarth environments such as caves, forests and buildings. The lack of flight data and performance metrics poses a gap that ...
Vefa Narli, Paul Y. Oh
112
Voted
APLAS
2004
ACM
15 years 9 months ago
Automatic Generation of Editors for Higher-Order Data Structures
With generic functional programming techniques, we have eased GUI programming by constructing a programming toolkit with which one can create GUIs in an abstract and compositional ...
Peter Achten, Marko C. J. D. van Eekelen, Rinus Pl...