Several types of network trafic have been shown to exhibit long-range dependence (LRD). In this work, we show that the busy period of an ATM system driven by a long-range dependen...
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin...