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139
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DFT
1999
IEEE
119views VLSI» more  DFT 1999»
15 years 8 months ago
RAMSES: A Fast Memory Fault Simulator
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu
PODS
2005
ACM
164views Database» more  PODS 2005»
16 years 3 months ago
Lower bounds for sorting with few random accesses to external memory
We consider a scenario where we want to query a large dataset that is stored in external memory and does not fit into main memory. The most constrained resources in such a situati...
Martin Grohe, Nicole Schweikardt
IJCNN
2007
IEEE
15 years 10 months ago
FEBAM: A Feature-Extracting Bidirectional Associative Memory
—In this paper, a new model that can ultimately create its own set of perceptual features is proposed. Using a bidirectional associative memory (BAM)-inspired architecture, the r...
Sylvain Chartier, Gyslain Giguère, Patrice ...
111
Voted
VTS
2000
IEEE
100views Hardware» more  VTS 2000»
15 years 8 months ago
Functional Memory Faults: A Formal Notation and a Taxonomy
Abstract: This paper presents a notation for describing functional fault models, which may occur in memory devices. Using this notation, the space of all possible memory faults has...
A. J. van de Goor, Zaid Al-Ars
BC
1999
81views more  BC 1999»
15 years 3 months ago
Error tolerant associative memory
Abstract-- This paper surveys two advanced associative memory models[8][5]. The first model was derived from the projection on a closed convex set spanned by patterns. The second m...
Cheng-Yuan Liou, Shao-Kuo Yuan