We present a novel method to estimate an approximation of the reflectance characteristics of optically thick, homogeneous translucent materials using only a single photograph as ...
Multiresolution analysis has been proposed as a basic tool supporting compression, progressive transmission, and level-of-detail control of complex meshes in a unified and theoret...
Andrew Certain, Jovan Popovic, Tony DeRose, Tom Du...
We consider the offset-deconstruction problem: Given a polygonal shape Q with n vertices, can it be expressed, up to a tolerance ε in Hausdorff distance, as the Minkowski sum o...
Eric Berberich, Dan Halperin, Michael Kerber, Roza...
We present a new method for the detection and estimation of multiple directional illuminants, using a single image of any object with known geometry and Lambertian reflectance. W...
This paper presents a complete solution to estimating a scene’s 3D geometry and appearance from multiple 2D images by using a statistical inverse ray tracing method. Instead of ...