Sciweavers

11061 search results - page 188 / 2213
» Computer Architecture
Sort
View
182
Voted
DAC
2006
ACM
16 years 8 months ago
Reliability challenges for 45nm and beyond
J. W. McPherson
180
Voted
VLSID
2007
IEEE
160views VLSI» more  VLSID 2007»
16 years 7 months ago
Deep Submicron Technology: Opportunity or Dead End for Dynamic Circuit Techniques
Claas Cornelius, Frank Grassert, Siegmar Koppe, Di...
164
Voted
VLSID
2007
IEEE
98views VLSI» more  VLSID 2007»
16 years 7 months ago
Power Reduction in VLIW Processor with Compiler Driven Bypass Network
Neeraj Goel, Anshul Kumar, Preeti Ranjan Panda
142
Voted
VLSID
2007
IEEE
112views VLSI» more  VLSID 2007»
16 years 7 months ago
Synthesizing "Verification Aware" Models: Why and How?
Malay K. Ganai, Akira Mukaiyama, Aarti Gupta, Kazu...
177
Voted
VLSID
2007
IEEE
127views VLSI» more  VLSID 2007»
16 years 7 months ago
Scalable techniques and tools for reliability analysis of large circuits
Debayan Bhaduri, Sandeep K. Shukla, Paul Graham, M...