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11061
search results - page 188 / 2213
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Computer Architecture
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DAC
2006
ACM
128
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Computer Architecture
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Reliability challenges for 45nm and beyond
16 years 4 months ago
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www.dcc.unicamp.br
J. W. McPherson
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119
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VLSID
2007
IEEE
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Deep Submicron Technology: Opportunity or Dead End for Dynamic Circuit Techniques
16 years 3 months ago
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www.imd.uni-rostock.de
Claas Cornelius, Frank Grassert, Siegmar Koppe, Di...
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103
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VLSID
2007
IEEE
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Power Reduction in VLIW Processor with Compiler Driven Bypass Network
16 years 3 months ago
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Neeraj Goel, Anshul Kumar, Preeti Ranjan Panda
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VLSID
2007
IEEE
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Synthesizing "Verification Aware" Models: Why and How?
16 years 3 months ago
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Malay K. Ganai, Akira Mukaiyama, Aarti Gupta, Kazu...
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115
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VLSID
2007
IEEE
127
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Scalable techniques and tools for reliability analysis of large circuits
16 years 3 months ago
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www.fermat.ece.vt.edu
Debayan Bhaduri, Sandeep K. Shukla, Paul Graham, M...
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