Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
In this paper, we present a new multi-packing tree (MP-tree) representation for macro placement to handle mixed-size designs. Based on binary trees, the MP-tree is very efficient,...
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shif...
In this paper we present a new global router appropriate for Multichip Module MCM and dense Printed Circuit Board PCB design, which utilizes a hybrid of the classical rip-up and r...
While previous watermarking-based approaches to intellectual property protection (IPP) have asymmetrically emphasized the IP provider's rights, the true goal of IPP is to ens...
Andrew E. Caldwell, Hyun-Jin Choi, Andrew B. Kahng...