As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
ASIC provides more than an order of magnitude advantage in terms of density, speed, and power requirement per gate. However, economic (cost of masks) and technological (deep micro...
Jennifer L. Wong, Farinaz Koushanfar, Miodrag Potk...
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...