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139

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VLSID
2004
IEEE

93views VLSI» more VLSID 2004»

Random Access Scan: A solution to test power, test data volume and test time

16 years 5 months ago

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Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara

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117

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VLSID
2004
IEEE

75views VLSI» more VLSID 2004»

Quantitative Model for Thermal Behaviour of an Analog Integrated Circuit

16 years 5 months ago

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Gagandeep S. Sandha, Pawan K. Singh, C. Pradeep Ku...

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116

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VLSID
2004
IEEE

95views VLSI» more VLSID 2004»

Embedded Hardware Face Detection

16 years 5 months ago

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Theo Theocharides, Greg M. Link, Narayanan Vijaykr...

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109

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VLSID
2003
IEEE

91views VLSI» more VLSID 2003»

High Level Modeling and Validation Methodologies for Embedded Systems: Bridging the Productivity Gap

16 years 5 months ago

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Sandeep K. Shukla, Jean-Pierre Talpin, Stephen A. ...

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125

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VLSID
2002
IEEE

82views VLSI» more VLSID 2002»

Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST

16 years 5 months ago

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