Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs...
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep...
Abstract. Designers of large parallel computers and clusters are becoming increasingly concerned with the cost and power consumption of the interconnection network. A simple way to...
Structuring and mapping of a Boolean function is an important problem in the design of complex integrated circuits. Libraryaware constructive decomposition offers a solution to th...
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
Jian Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileg...