Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
An aggregate congestion control mechanism, namely ProbeAided MulTCP (PA-MulTCP), is proposed in this paper. It is based on MulTCP, a proposal for enabling an aggregate to emulate ...
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Many new Partitioned Global Address Space (PGAS) programming languages have recently emerged and are becoming ubiquitously available on nearly all modern parallel architectures. PG...
Mohamed Bakhouya, Jaafar Gaber, Tarek A. El-Ghazaw...
Ever-growing complexity is forcing design to move above RTL. For example, golden functional models are being written as clearly as possible in software and not optimized or intend...