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DSD
2005
IEEE
96views Hardware» more  DSD 2005»
15 years 7 months ago
Improvement of the Fault Coverage of the Pseudo-Random Phase in Column-Matching BIST
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
Peter Filter, Hana Kubatova
GRAPHITE
2005
ACM
15 years 10 months ago
A VR platform for field-scale phenomena: an application to fire spread experiments
Digital computers are powerful tools for studying natural phenomena at large-scales. Nevertheless, custom-made methods have to be developed to digitalize, simulate and finally vis...
Alexandre Muzy, Nicolas Fauvet, Patrick Bourdot, F...
ICML
2006
IEEE
16 years 6 months ago
Learning to impersonate
Consider Alice, who is interacting with Bob. Alice and Bob have some shared secret which helps Alice identify Bob-impersonators. Now consider Eve, who knows Alice and Bob, but doe...
Moni Naor, Guy N. Rothblum
ECCV
2008
Springer
16 years 7 months ago
Understanding Camera Trade-Offs through a Bayesian Analysis of Light Field Projections
Computer vision has traditionally focused on extracting structure, such as depth, from images acquired using thin-lens or pinhole optics. The development of computational imaging i...
Anat Levin, William T. Freeman, Frédo Duran...
ECCV
2002
Springer
16 years 7 months ago
Maximizing Rigidity: Optimal Matching under Scaled-Orthography
Establishing point correspondences between images is a key step for 3D-shape computation. Nevertheless, shape extraction and point correspondence are treated, usually, as two diffe...
João Costeira, João Maciel