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DAC
2007
ACM
16 years 4 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
114
Voted
DAC
1999
ACM
16 years 4 months ago
Hypergraph Partitioning with Fixed Vertices
We empirically assess the implications of fixed terminals for hypergraph partitioning heuristics. Our experimental testbed incorporates a leading-edge multilevel hypergraph partit...
Andrew E. Caldwell, Andrew B. Kahng, Igor L. Marko...
DAC
2000
ACM
16 years 4 months ago
Unifying behavioral synthesis and physical design
eously demand shorter and less costly design cycles. Designing at higher levels of abstraction makes both objectives achievable, but enabling techniques like behavioral synthesis h...
William E. Dougherty, Donald E. Thomas
DAC
2003
ACM
16 years 4 months ago
On-chip logic minimization
While Boolean logic minimization is typically used in logic synthesis, logic minimization can be useful in numerous other applications. However, many of those applications, such a...
Roman L. Lysecky, Frank Vahid
DAC
2004
ACM
16 years 4 months ago
Virtual memory window for application-specific reconfigurable coprocessors
Reconfigurable Systems-on-Chip (SoCs) on the market consist of full-fledged processors and large Field-Programmable Gate-Arrays (FPGAs). The latter can be used to implement the sy...
Miljan Vuletic, Laura Pozzi, Paolo Ienne
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