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EWSN
2010
Springer
15 years 9 months ago
2010
Springer
The proliferation of sensors in devices of frequent use, such as mobile phones, offers unprecedented opportunities for forming selfselected communities around shared sensory data ...
ICCAD
2007
IEEE
15 years 8 months ago
2007
IEEE
Abstract— This paper addresses the module assignment problem in pinlimited designs under the stacked-Vdd circuit paradigm. A partition-based algorithm is presented for efficient...
ICCAD
2005
IEEE
15 years 8 months ago
2005
IEEE
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
IEEEARES
2009
IEEE
15 years 6 months ago
2009
IEEE
—Making use of the World Wide Web’s numerous services increasingly requires the disclosure of personal user data. While these data represent an important value for service prov...
DATE
2009
IEEE
15 years 6 months ago
2009
IEEE
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...