In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
The polyhedral model provides powerful abstractions to optimize loop nests with regular accesses. Affine transformations in this model capture a complex sequence of execution-reord...
Dynamic power is the main source of power consumption in CMOS circuits. It depends on the square of the supply voltage. It may significantly be reduced by scaling down the supply ...
Noureddine Chabini, El Mostapha Aboulhamid, Yvon S...
Abstract. Until now, the great majority of research in low-power systems has assumed a convex power model. However, recently, due to the confluence of emerging technological and ar...
Ani Nahapetian, Foad Dabiri, Miodrag Potkonjak, Ma...
Success of Wireless Sensor Networks (WSN) largely depends on whether the deployed network can provide desired area coverage with acceptable network lifetime. This paper seeks to a...