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ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
15 years 5 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
BROADNETS
2005
IEEE
15 years 5 months ago
Dual-link failure resiliency through backup link mutual exclusion
— Networks employ link protection to achieve fast recovery from link failures. While the first link failure can be protected using link protection, there are several alternative...
Amit Chandak, Srinivasan Ramasubramanian
HICSS
2005
IEEE
154views Biometrics» more  HICSS 2005»
15 years 5 months ago
Market Structure and the Predictability of Electricity System Line Flows: An Experimental Analysis
Robert Thomas has shown, using simulations of experimental results, that the power flow on any line in an electric network is linearly proportional to the total system load when t...
Nodir Adilov, Thomas Light, Richard E. Schuler, Wi...
INFOCOM
2005
IEEE
15 years 5 months ago
Provably competitive adaptive routing
Abstract— An ad hoc wireless network is an autonomous selforganizing system of mobile nodes connected by wireless links where nodes not in direct range communicate via intermedia...
Baruch Awerbuch, David Holmer, Herbert Rubens, Rob...
KBSE
2005
IEEE
15 years 5 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...