62 search results - page 12 / 13 » Concurrent Fault Detection in Random Combinational Logic |
ISCIS
2004
Springer
13 years 12 months ago
2004
Springer
Testing is a necessary, but costly process for user-centric quality control. Moreover, testing is not comprehensive enough to completely detect faults. Many formal methods have bee...
DSN
2009
IEEE
14 years 1 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
POPL
2004
ACM
14 years 6 months ago
2004
ACM
Ensuring the correctness of multithreaded programs is difficult, due to the potential for unexpected interactions between concurrent threads. Much previous work has focused on det...
DAC
2007
ACM
14 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
SP
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Most security mechanisms proposed to date unquestioningly place trust in microprocessor hardware. This trust, however, is misplaced and dangerous because microprocessors...