4299 search results - page 100 / 860 » Concurrent Test Generation |
88
Voted
DAC
1999
ACM
16 years 4 months ago
1999
ACM
104
Voted
CHI
2005
ACM
16 years 3 months ago
2005
ACM
Software systems are often complex in the number of features that are available through the user interface and consequently, the number of interactions that can occur. Such system...
122
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DSD
2008
IEEE
15 years 9 months ago
2008
IEEE
We propose a method to efficiently design a “parity generator”, which is a stand-alone block producing multiple parity bits of a given circuit. The parity generator is designe...
133
Voted
ICSEA
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
126
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FATES
2004
Springer
15 years 8 months ago
2004
Springer
This paper presents a method for reducing the cost of test generation. A spanning set for a coverage criterion is a set of entities such that exercising every entity in the spannin...