4299 search results - page 101 / 860 » Concurrent Test Generation |
123
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DATE
2000
IEEE
15 years 7 months ago
2000
IEEE
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
163
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MTV
2005
IEEE
15 years 9 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
111
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ITC
1998
IEEE
15 years 7 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
100
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VLSID
2006
IEEE
15 years 9 months ago
2006
IEEE
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
115
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ICCAD
1999
IEEE
15 years 7 months ago
1999
IEEE
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...