4299 search results - page 103 / 860 » Concurrent Test Generation |
119
Voted
ICSE
2007
IEEE-ACM
16 years 3 months ago
2007
IEEE-ACM
The incorporation of context-awareness capabilities into pervasive applications allows them to leverage contextual information to provide additional services while maintaining an ...
119
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MTDT
2003
IEEE
15 years 8 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
118
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PTS
1993
15 years 4 months ago
1993
The signal SAVE construct is one of the features distinguishing SDL from convent specification and programming languages. On the other hand, this feature increase testing SDL-spec...
154
Voted
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
15 years 1 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
131
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SE
2008
15 years 4 months ago
2008
We propose a new method for system validation by means of testing, which is based on environment models expressed as UML state machines. A sun blind control case study serves to il...