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» Concurrent Test Generation

172

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CP
2005
Springer

95views Artificial Intelligence» more CP 2005»

Test Instance Generation for MAX 2SAT

16 years 25 days ago

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Mistuo Motoki

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161

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GECCO
2005
Springer

100views Optimization» more GECCO 2005»

Improving network applications security: a new heuristic to generate stress testing data

16 years 24 days ago

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Concettina Del Grosso, Giuliano Antoniol, Massimil...

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121

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DAC
2004
ACM

101views Computer Architecture» more DAC 2004»

Industrial experience with test generation languages for processor verification

16 years 22 days ago

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Michael L. Behm, John M. Ludden, Yossi Lichtenstei...

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145

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FATES
2004
Springer

79views Software Engineering» more FATES 2004»

Symbolic Test Case Generation for Primitive Recursive Functions

16 years 20 days ago

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Achim D. Brucker, Burkhart Wolff

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146

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FMCO
2004
Springer

97views Formal Methods» more FMCO 2004»

A Theory of Predicate-Complete Test Coverage and Generation

16 years 20 days ago

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