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DATE
2003
IEEE
109views Hardware» more  DATE 2003»
15 years 8 months ago
Fully Automatic Test Program Generation for Microprocessor Cores
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DATE
2003
IEEE
62views Hardware» more  DATE 2003»
15 years 8 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...
DFT
2003
IEEE
81views VLSI» more  DFT 2003»
15 years 8 months ago
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
KBSE
2003
IEEE
15 years 8 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...