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search results - page 109 / 860
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Concurrent Test Generation
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DATE
2003
IEEE
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Hardware
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Fully Automatic Test Program Generation for Microprocessor Cores
15 years 8 months ago
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Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
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DATE
2003
IEEE
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Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
15 years 8 months ago
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Hideyuki Ichihara, Tomoo Inoue
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DATE
2003
IEEE
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RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
15 years 8 months ago
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Marcelino B. Santos, José M. Fernandes, Isa...
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DFT
2003
IEEE
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A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
15 years 8 months ago
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Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
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KBSE
2003
IEEE
99
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Software Engineering
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Automated Requirements-based Generation of Test Cases for Product Families
15 years 8 months ago
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Clémentine Nebut, Simon Pickin, Yves Le Tra...
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