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ICSE
2009
IEEE-ACM
15 years 8 months ago
Automated Test Program Generation for an Industrial Optimizing Compiler
Chen Zhao, Yunzhi Xue, Qiuming Tao, Liang Guo, Zha...
109
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ATS
2000
IEEE
86views Hardware» more  ATS 2000»
15 years 7 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...