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» Concurrent Test Generation
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88
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ISQED
2000
IEEE
77views Hardware» more  ISQED 2000»
15 years 7 months ago
Efficient Hierarchical Approach to Test Generation for Digital Systems
Raimund Ubar, Jaan Raik
69
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ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 7 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha
108
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ICCAD
1999
IEEE
72views Hardware» more  ICCAD 1999»
15 years 7 months ago
Validation and test generation for oscillatory noise in VLSI interconnects
: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer