Sciweavers

4299 search results - page 112 / 860
» Concurrent Test Generation
Sort
View
ICTAI
2000
IEEE
15 years 11 months ago
A genetic algorithm-based system for generating test programs for microprocessor IP cores
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
136
Voted
ISQED
2000
IEEE
77views Hardware» more  ISQED 2000»
15 years 11 months ago
Efficient Hierarchical Approach to Test Generation for Digital Systems
Raimund Ubar, Jaan Raik
117
Voted
ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 11 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha
181
Voted
ICCAD
1999
IEEE
72views Hardware» more  ICCAD 1999»
15 years 11 months ago
Validation and test generation for oscillatory noise in VLSI interconnects
: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer