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search results - page 112 / 860
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Concurrent Test Generation
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ICTAI
2000
IEEE
80
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Artificial Intelligence
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ICTAI 2000
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A genetic algorithm-based system for generating test programs for microprocessor IP cores
15 years 7 months ago
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dit.upc.es
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
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88
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ISQED
2000
IEEE
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Hardware
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ISQED 2000
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Efficient Hierarchical Approach to Test Generation for Digital Systems
15 years 7 months ago
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www.pld.ttu.ee
Raimund Ubar, Jaan Raik
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69
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ASPDAC
2000
ACM
102
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Hardware
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ASPDAC 2000
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Causality based generation of directed test cases
15 years 7 months ago
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www.ninasaxena.com
Nina Saxena, Jacob A. Abraham, Avijit Saha
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111
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ARITH
1999
IEEE
100
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Applied Computing
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ARITH 1999
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Number-Theoretic Test Generation for Directed Rounding
15 years 7 months ago
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hardware.ispras.ru
Michael Parks
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108
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ICCAD
1999
IEEE
72
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Hardware
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ICCAD 1999
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Validation and test generation for oscillatory noise in VLSI interconnects
15 years 7 months ago
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poisson.usc.edu
: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
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