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ESEC
1999
Springer
15 years 7 months ago
Using Model Checking to Generate Tests from Requirements Specifications
Angelo Gargantini, Constance L. Heitmeyer
104
Voted
ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 7 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
FM
1998
Springer
198views Formal Methods» more  FM 1998»
15 years 7 months ago
Automated Test Set Generation for Statecharts
Kirill Bogdanov, Mike Holcombe, Harbhajan Singh
GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
15 years 7 months ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...