Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
PDF Tools
Image Tools
Text Tools
OCR Tools
Symbol and Emoji Tools
On-screen Keyboard
Latex Math Equation to Image
Smart IPA Phonetic Keyboard
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
4299
search results - page 117 / 860
»
Concurrent Test Generation
Sort
relevance
views
votes
recent
update
View
thumb
title
107
Voted
DAC
1991
ACM
95
views
Computer Architecture
»
more
DAC 1991
»
A Transitive Closure Based Algorithm for Test Generation
15 years 7 months ago
Download
www.cs.tufts.edu
Srimat T. Chakradhar, Vishwani D. Agrawal
claim paper
Read More »
110
click to vote
ICTAI
1994
IEEE
119
views
Artificial Intelligence
»
more
ICTAI 1994
»
GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
15 years 7 months ago
Download
www.cad.polito.it
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
claim paper
Read More »
109
Voted
ITC
1994
IEEE
136
views
Hardware
»
more
ITC 1994
»
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
15 years 7 months ago
Download
www.cad.polito.it
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
claim paper
Read More »
75
Voted
ASPDAC
2008
ACM
78
views
Hardware
»
more
ASPDAC 2008
»
Robust test generation for power supply noise induced path delay faults
15 years 5 months ago
Download
www.aspdac.com
Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
claim paper
Read More »
97
click to vote
ISSTA
2010
ACM
168
views
Software Engineering
»
more
ISSTA 2010
»
Generating test cases for specification mining
15 years 5 months ago
Download
www.st.cs.uni-saarland.de
Valentin Dallmeier, Nikolai Knopp, Christoph Mallo...
claim paper
Read More »
« Prev
« First
page 117 / 860
Last »
Next »