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107
Voted
DAC
1991
ACM
15 years 7 months ago
A Transitive Closure Based Algorithm for Test Generation
Srimat T. Chakradhar, Vishwani D. Agrawal
109
Voted
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 7 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
75
Voted
ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
15 years 5 months ago
Robust test generation for power supply noise induced path delay faults
Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
ISSTA
2010
ACM
15 years 5 months ago
Generating test cases for specification mining
Valentin Dallmeier, Nikolai Knopp, Christoph Mallo...