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» Concurrent Test Generation
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180
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GLVLSI
2008
IEEE
140views VLSI» more  GLVLSI 2008»
15 years 8 months ago
Guided test generation for isolation and detection of embedded trojans in ics
Mainak Banga, Maheshwar Chandrasekar, Lei Fang, Mi...
129
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AMC
2010
73views more  AMC 2010»
15 years 7 months ago
Re-seeding invalidates tests of random number generators
Hans Ekkehard Plesser, Anders Grønvik Jahns...
94
Voted
CORR
2010
Springer
52views Education» more  CORR 2010»
15 years 7 months ago
Syntactic Abstraction of B Models to Generate Tests
Jacques Julliand, Nicolas Stouls, Pierre-Christoph...
149
Voted
CJ
2006
107views more  CJ 2006»
15 years 7 months ago
Automated Unique Input Output Sequence Generation for Conformance Testing of FSMs
Karnig Derderian, Robert M. Hierons, Mark Harman, ...