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PCS
2008
52views more  PCS 2008»
15 years 3 months ago
Automation of broad sanity test generation
R. S. Zybin, Victor V. Kuliamin, A. V. Ponomarenko...
COMPUTER
1999
67views more  COMPUTER 1999»
15 years 3 months ago
Current Directions in Automatic Test-Pattern Generation
Kwang-Ting Cheng, Angela Krstic
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TODAES
1998
64views more  TODAES 1998»
15 years 3 months ago
Functional test generation for delay faults in combinational circuits
Irith Pomeranz, Sudhakar M. Reddy