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Concurrent Test Generation
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DAM
2007
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The test suite generation problem: Optimal instances and their implications
15 years 3 months ago
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www.cs.uwm.edu
Christine T. Cheng
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ENTCS
2007
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Model-driven Transformation-based Generation of Java Stress Tests
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faculty.ist.unomaha.edu
Victor L. Winter
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PCS
2008
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Automation of broad sanity test generation
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panda.ispras.ru
R. S. Zybin, Victor V. Kuliamin, A. V. Ponomarenko...
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COMPUTER
1999
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Current Directions in Automatic Test-Pattern Generation
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cadlab.ece.ucsb.edu
Kwang-Ting Cheng, Angela Krstic
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TODAES
1998
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Functional test generation for delay faults in combinational circuits
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Irith Pomeranz, Sudhakar M. Reddy
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