Sciweavers

4299 search results - page 125 / 860
» Concurrent Test Generation
Sort
View
138
Voted
VTS
2002
IEEE
108views Hardware» more  VTS 2002»
15 years 8 months ago
On Using Efficient Test Sequences for BIST
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
René David, Patrick Girard, Christian Landr...
260
Voted
LPAR
2012
Springer
13 years 11 months ago
Smart Testing of Functional Programs in Isabelle
Abstract. We present a novel counterexample generator for the interactive theorem prover Isabelle based on a compiler that synthesizes test data generators for functional programmi...
Lukas Bulwahn
128
Voted
SAC
2010
ACM
15 years 10 months ago
Checking concurrent contracts with aspects
The applicability of aspects as a means of implementing runtime contract checking has been demonstrated in prior work, where contracts are identified as cross-cutting concerns [1...
Eric Kerfoot, Steve McKeever
AOSD
2008
ACM
15 years 5 months ago
AspectT: aspect-oriented test case instantiation
e instantiation is the transformation of abstract test cases cutable test scripts. Abstract test cases are either created during model based test case generation or are manually d...
Sebastian Benz
101
Voted
ICIP
2009
IEEE
16 years 4 months ago
Memory-less Bit-plane Coder Architecture For Jpeg2000 With Concurrent Column-stripe Coding
In implementing an efficient block coder for JPEG2000, the memories required for storing the state variables dominate the hardware cost of a block coder. In this paper, we propose...