4299 search results - page 145 / 860 » Concurrent Test Generation |
138
Voted
CAV
2006
Springer
15 years 7 months ago
2006
Springer
Many multithreaded programs employ concurrent data types to safely share data among threads. However, highly-concurrent algorithms for even seemingly simple data types are difficul...
109
Voted
DAC
1997
ACM
15 years 7 months ago
1997
ACM
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
147
Voted
EURODAC
1995
IEEE
15 years 7 months ago
1995
IEEE
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...
138
Voted
ISSTA
2010
ACM
15 years 7 months ago
2010
ACM
Recently, there has been much interest in developing analyzes to detect concurrency bugs that arise because of data races, atomicity violations, execution omission, etc. However, ...
114
Voted
ISSTA
2006
ACM
15 years 9 months ago
2006
ACM
Creating effective test cases is a difficult problem, especially for web applications. To comprehensively test a web application’s functionality, test cases must test complex a...