4299 search results - page 147 / 860 » Concurrent Test Generation |
149
Voted
ITC
1996
IEEE
15 years 7 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
109
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IPPS
2010
IEEE
15 years 1 months ago
2010
IEEE
Abstract--In this article we present KRASH, a tool for reproducible generation of system-level CPU load. This tool is intended for use in shared memory machines equipped with multi...
135
Voted
FATES
2003
Springer
15 years 8 months ago
2003
Springer
Use of model-checking approaches for test generation from requirement models have been proposed by several researchers. These approaches leverage the witness (or counter-example) ...
121
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
129
Voted
ACSC
2004
IEEE
15 years 7 months ago
2004
IEEE
The collision test is an important statistical test for rejecting poor random number generators. The test simulates the throwing of balls randomly into urns. A problem in applying...