4299 search results - page 148 / 860 » Concurrent Test Generation |
137
Voted
COMPSAC
1996
IEEE
15 years 7 months ago
1996
IEEE
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...
153
Voted
ICSEA
2007
IEEE
15 years 9 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
107
Voted
ISSTA
2006
ACM
15 years 9 months ago
2006
ACM
Test campaigns usually require only a restricted subset of paths in a program to be thoroughly tested. As random testing (RT) offers interesting fault-detection capacities at low ...
133
Voted
DSD
2010
IEEE
15 years 2 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
146
Voted
FM
2006
Springer
15 years 7 months ago
2006
Springer
Non-determinism of the thread schedule is a well-known problem in concurrent programming. However, other sources of non-determinism exist which cannot be controlled by an applicati...