4299 search results - page 152 / 860 » Concurrent Test Generation |
136
Voted
IOLTS
2003
IEEE
15 years 8 months ago
2003
IEEE
We discuss the design of a novel analog checker that monitors two duplicate signals and provides a digital error indication when their absolute difference is unacceptably large. Th...
169
Voted
ACST
2006
15 years 5 months ago
2006
Adaptive fault isolation methods based on discrepancyenabled pairwise comparisons are developed for reconfigurable logic devices. By observing the discrepancy characteristics of m...
145
Voted
SPIN
2010
Springer
15 years 1 months ago
2010
Springer
Concolic testing is a method for test input generation where a given program is executed both concretely and symbolically at the same time. This paper introduces the LIME Concolic ...
117
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GLVLSI
2005
IEEE
15 years 9 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
139
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DAC
1999
ACM
16 years 4 months ago
1999
ACM
Software synthesis from a concurrent functional specification is a key problem in the design of embedded systems. A concurrent specification is well-suited for medium-grained part...