4299 search results - page 155 / 860 » Concurrent Test Generation |
136
Voted
ICSM
2005
IEEE
15 years 9 months ago
2005
IEEE
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
116
Voted
VLSID
2003
IEEE
16 years 4 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
125
Voted
ACSD
2003
IEEE
15 years 7 months ago
2003
IEEE
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously prese...
129
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VLSID
2005
IEEE
16 years 4 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
123
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ICST
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper presents a method of component testing based on algebraic specifications. An algorithm for generating checkable test cases is proposed. A prototype testing tool called ...